Syllabus

LEARNING OUTCOMES

Credits: 5

Schedule: 07.09.2020 - 03.12.2020

Teacher in charge (valid 01.08.2020-31.07.2022): Girish Tewari

Teacher in charge (applies in this implementation): Yanling Ge, Roman Nowak, Girish Tewari

Contact information for the course (applies in this implementation):

This
course is an introduction for Master's students to Materials
Characterization. It is mandatory to all Funtional Materials (FM) major
students. The maximum amount of students on the course is limited and
the FM major students have priority. Note that the course  registration
will close before the course starts and all accepted students will get a
confirmation.

Syllabus: In this course first day of week one
lecture dedicated to the the theoretical part, will be delivered and this
will be followed by experimental sessions for rest four days of the
week. Following are the topics

CEFR level (applies in this implementation):

Language of instruction and studies (valid 01.08.2020-31.07.2022):

Teaching language: English

Languages of study attainment: English

CONTENT, ASSESSMENT AND WORKLOAD

Content

• Valid 01.08.2020-31.07.2022:

  At this course, the student can exploit most common materials characterization methods to characterize the structure and properties of materials. The student can evaluate the capabilities and limitations of major materials and surface characterization techniques such as: Optical microscopy, nanoindentation, Raman, Electronic Transport, XRF, XRD, AFM, TEM, SEM, EDS, WDS, XPS.

• Applies in this implementation:

  1.  X-Ray
  Diffraction Methods, (XRD): X-ray radiation, Instrumentation,
  Theoretical Background, X-ray diffractometry           Contact session 1
  
  

  2.  Transmission
  Electron Microscopy  (TEM): Instrumentation, Specimen preparation,
  Image modes                                           Contact session 2

  3. Nanoindentation Examination of Crystalline
  Solid Surfaces”   General
  Introduction, Indentation Data, Nanoindentation
  of Ceramics, Semiconductors, and Superconductors
                                                                           
                                                                         
                                    Contact session 3
  

  4. Optical  Microscopy (OM) : Operating principles, Instrumentation, Imaging Modes, Confocal Microscopy  Contact session 4
  

  5. 
  Scanning Electron Microscopy (SEM): Instrumentation, Contrast formation, Operation variables, Specimen Preparation Contact session 5
  

  6. X-Ray spectroscopy for
  Elemental Analysis  (EDS+WDS): Features of Characteristic
  X-rays, X-Ray Fluorescence
  Spectrometry (WDS and EDS), EDS in Electron Microscopes, Qualitative and
  Quantitative Analysis Contact session 6

  7. Electronic Transport in Semiconductors: Electronic Band (structure) diagrams of semiconductors, Resistvity and Hall effect theory and experiment    Contact session 7
  

  8. Vibrational Spectroscopy for Molecular Analysis, (Raman): Theoretical Background, Raman Microscopy, Interpretation of
  Vibrational SpectraContact session 8
  

  9. 
  Electron Spectroscopy for Surface Analysis (XPS ): Basic Principles 
  (XPS), Instrumentation, Characteristics of Electron Spectra  (XPS ), Qualitative
  and Quantitative Analysis  Contact session 9

  10.  Secondary Ion Mass Spectrometry for Surface Analysis, SIMS: Basci Principles, Instrumentation, Surface structure analysis, SIMS imaging, SIMS depth profilingContact session 10

  
  

  
  

  
  

  
  

Assessment Methods and Criteria

• Valid 01.08.2020-31.07.2022:

  Weekly seminars, 5 laboratory projects, written reports, examination

• Applies in this implementation:

  Evaluation criteria
  
  1. 5 laboratory reports (including the
  pre-task), 60 %
  At
  least 4 laboratory participations are requirement to pass the course [get to
  the exam]
  Laboratory report

  Laboratory
  report (5 x 12p.) = 60 marks
  

  2.  Oral Exam, 30 %
  
  Contact sessions and exam

  Oral exam  = 30 marks

         - A method (max. 10 p.)

         -
  Interpretation of a case ( max. 20 p.) 

  3. Other tasks 10 % (Not obligatory)
  
  
  

  Course feedback (webpropol)    4

  Analysis
  of the data: case study (volunteer)                  6

   Total = 10 marks
  

  Minimum
  60 marks to pass the course Grade
  table provided after all oral exams completed
  
  

Workload

• Valid 01.08.2020-31.07.2022:

  5 cr = 135 h

  Contact teaching

  5 Laboratory works

  Independent work and reporting

  Reporting

• Applies in this implementation:

  Contact session 1.5 hrs.

  Laboratory Practice 16 hrs.

  In total 17.5 hrs. per week.

  
  

DETAILS

Study Material

• Valid 01.08.2020-31.07.2022:

  Yang Leng, Materials Characterization : Introduction to Microscopic and Spectroscopic Methods", Wiley-VCH, 2013

• Applies in this implementation:

  Course material is available at MyCourses.fi page under section course material
  

Prerequisites

• Valid 01.08.2020-31.07.2022:

  Laboratory safety course CHEM-A1010 or CHEM-E0140

FURTHER INFORMATION

Details on the schedule

• Applies in this implementation:

  Tentative timetable for the contact sessions and laboratory works
  

  (will be updated when confirmed)

  Week	Contact session Date	Contact session	Laboratory	Pre-assignment
  37	7.9	Introduction to different methods (+ exam questions)	-	XRD Pre-task
  38	14.9	XRD	XRD	TEM Pre-task
  39	21.9	TEM		Nanoindentation       Pre-task
  40	28.9	Nanoindentation	Nanoindentation	Optical Microscopy      Pre-task
  41	5.10	Optical Microscopy (OM)		SEM Pre-task
  42	12.10	SEM	SEM+OM	EDS Pre-task
  43	exam week	-	-	-
  44	26.10	EDS		Electronic Transport Pre-task
  45	2.11	Electronic Transport (ET)	Electronic Transport	Raman Pre-task
  46	9.11	Raman	Raman	XPS Pre-task
  47	16.11	XPS		Auger and SIMS        Pre-task
  48	23.11	Auger and SIMS + Course summary	-	-
  49		-	Oral exam slots (30.11)	-
  50	exam week	-	Oral exam slots (7.12, 13.12 and 14.12)	-

  
  

Description

Registration and further information