LEARNING OUTCOMES
After the course, students will understand the basic microscopy theory for electron microscopes and learns how to use following microscopy methods for material science applications:
1. Transmission electron microscopy TEM
2. Scanning electron microscopy SEM
3. Atomic force microscopy
4. Electron microscopy tomography
Credits: 5
Schedule: 07.01.2025 - 08.04.2025
Teacher in charge (valid for whole curriculum period):
Teacher in charge (applies in this implementation): Hua Jiang, Janne Ruokolainen
Contact information for the course (applies in this implementation):
CEFR level (valid for whole curriculum period):
Language of instruction and studies (applies in this implementation):
Teaching language: English. Languages of study attainment: English
CONTENT, ASSESSMENT AND WORKLOAD
Content
valid for whole curriculum period:
The course gives basic knowledge of the microscopy of materials nanoscale structures - including soft and hard materials. Lectures will concentrate on transmission electron microscopy (TEM), cryo-electron microscopy, high resolution imaging, electron diffraction and analytical microscopy by using elemental analyses (EDX, EELS). Additionally scanning electron microscopy (SEM), atomic force microscopy (AFM) and methods to prepare samples are lectures.
Assessment Methods and Criteria
valid for whole curriculum period:
Teaching methods: Lectures
Assessment criteria: Exam
Workload
valid for whole curriculum period:
Lectures
DETAILS
Substitutes for Courses
valid for whole curriculum period:
Prerequisites
valid for whole curriculum period:
FURTHER INFORMATION
Further Information
valid for whole curriculum period:
Teaching Language: English
Teaching Period: 2024-2025 Spring III - IV
2025-2026 Spring III - IV