ELEC-E8712 - Design for Reliability, Lecture, 3.9.2024-28.11.2024

Please note! Course description is confirmed for two academic years, which means that in general, e.g. Learning outcomes, assessment methods and key content stays unchanged. However, via course syllabus, it is possible to specify or change the course execution in each realization of the course, such as how the contact sessions are organized, assessment methods weighted or materials used.

LEARNING OUTCOMES

The purpose of the course is to provide a comprehensive understanding about the factors that affect the reliability of novel electronic products. The emphasis is placed on the fundamentals of electronics integration and packaging, accelerated reliability testing, life-time prediction methods and physics of failure analysis and mechanisms. After the course, the student should have a general understanding on the most common materials, structures, manufacturing methods and failure mechanisms of typical electronic components, packages, modules and devices.

Credits: 5

Schedule: 03.09.2024 - 28.11.2024

Teacher in charge (valid for whole curriculum period):

Teacher in charge (applies in this implementation): Vesa Vuorinen, Mervi Paulasto-Kröckel

Contact information for the course (applies in this implementation):

For all course related matters please contact Vesa via e-mail

Vesa.Vuorinen(ät)aalto.fi

CEFR level (valid for whole curriculum period):

Language of instruction and studies (applies in this implementation):

Teaching language: English. Languages of study attainment: English

CONTENT, ASSESSMENT AND WORKLOAD

Content

  • valid for whole curriculum period:

    Basics of the design for reliability and manufacturability. FMEA analysis and reliability metrology. Reliability prediction methods of electronic products. Different accelerated reliability testing methods. Electronics packaging and integration. Failure mechanisms related failure analysis methods in different hierarchical levels of electronic systems.

  • applies in this implementation

    Please check course syllabus and 1st lecture material for more information. Those are found under "Materials" section

Assessment Methods and Criteria

  • valid for whole curriculum period:

    Midterm exams and Assignments

  • applies in this implementation

    Please check course syllabus and 1st lecture material for more information. Those are found under "Materials" section

Workload

  • valid for whole curriculum period:

    Lectures and Midterm exams

    Independent work (Incl. Assignments)

  • applies in this implementation

    Please check course syllabus and 1st lecture material for more information. Those are found under "Materials" section

DETAILS

Study Material

  • valid for whole curriculum period:

    Handouts with supplementary backing material

    For self-studying or distant learning:

    Laurila, T., Vuorinen, V., Paulasto-Kröckel, M., Turunen, M., Mattila, T.T., Kivilahti, J., Interfacial Compatibility in Microelectronics

    J. Liu, Reliability of Microtechnology

    D. Crow, A. Feinberg, Design for reliability

    D. H. Stamatis, Failure mode and effect analysis: FMEA from theory to execution

  • applies in this implementation

    Please check course syllabus and 1st lecture material for more information. Those are found under "Materials" section

Substitutes for Courses
Prerequisites

FURTHER INFORMATION

Further Information

  • valid for whole curriculum period:

    Teaching Language: English

    Teaching Period: 2024-2025 Autumn I - II
    2025-2026 Autumn I - II

Details on the schedule

  • applies in this implementation

    The detailed schedule is presented at the front page ("General") of the course

Rules of Conduct - Students´ Rights and Responsibilities (in force from 1 August 2020)

Aalto University Code of Academic Integrity and Handling Violations Thereof