LEARNING OUTCOMES
After the course, the students will be able to:
· Outline the operating principles and role of SEM-EDS in sample characterization
· Justify the device parameters (SEM + sample preparation) for specific samples
· Plan and execute the methodology for sample characterization with SEM-EDS
· Recognize the capabilities of the new instrument
· Apply the acquired hands-on experience to independently work on the instrument with their own samples
Credits: 3
Schedule: 12.11.2024 - 17.01.2025
Teacher in charge (valid for whole curriculum period):
Teacher in charge (applies in this implementation): Anna Klemettinen, Lassi Klemettinen, Eero Haimi
Contact information for the course (applies in this implementation):
CEFR level (valid for whole curriculum period):
Language of instruction and studies (applies in this implementation):
Teaching language: English. Languages of study attainment: English
CONTENT, ASSESSMENT AND WORKLOAD
Content
valid for whole curriculum period:
This course is open to doctoral students from the School of Chemical Engineering. It offers an excellent opportunity to expand your knowledge in scanning electron microscopy (SEM) and X-ray spectroscopy. You will also receive specialized training on the new SEM-EDS instrument (JEOL JSM-IT800HL SEM with Oxford Instruments Aztec Live Premium Ultim Max 100 EDS).
The course includes lectures from experts with extensive experience in SEM-EDS, seminars where students will present their analyses, and practical, hands-on training with the SEM-EDS system. Throughout the course, you will explore the fundamentals of electron microscopy and spectroscopy, as well as the operating principles of SEM-EDS in sample characterization. You will also gain practical experience by working with your own samples.
By the end of the course, you will have the skills to independently operate the SEM-EDS equipment.
DETAILS
Substitutes for Courses
valid for whole curriculum period:
Prerequisites
valid for whole curriculum period: