Syllabus

Credits: 5

Schedule: 08.01.2019 - 10.04.2019

Teaching Period (valid 01.08.2018-31.07.2020): 

III - IV Spring (2018-2019, 2019-2020)

Learning Outcomes (valid 01.08.2018-31.07.2020): 

After the course, students will understand the basic microscopy theory for electron microscopes and learns how to use following microscopy methods for material science applications:

1. Transmission electron microscopy TEM

2. Scanning electron microscopy SEM

3. Atomic force microscopy

4. Electron microscopy tomography

Content (valid 01.08.2018-31.07.2020): 

The course gives basic knowledge of the microscopy of materials nanoscale structures - including soft and hard materials. Lectures will concentrate on transmission electron microscopy (TEM), cryo-electron microscopy, high resolution imaging, electron diffraction and analytical microscopy by using elemental analyses (EDX, EELS). Additionally scanning electron microscopy (SEM), atomic force microscopy (AFM) and methods to prepare samples are lectures.

Assessment Methods and Criteria (valid 01.08.2018-31.07.2020): 

Teaching methods: Lectures 22h  2h/week
Assessment criteria: Exam

Workload (valid 01.08.2018-31.07.2020): 

24 + 24 (2 + 2)

Study Material (valid 01.08.2018-31.07.2020): 

to be announced

Substitutes for Courses (valid 01.08.2018-31.07.2020): 

This course replaces the course Tfy-125.4313 Microscopy of Nanomaterials.

Course Homepage (valid 01.08.2018-31.07.2020): 

https://mycourses.aalto.fi/course/search.php?search=PHYS-E0525

Grading Scale (valid 01.08.2018-31.07.2020): 

0-5

Registration for Courses (valid 01.08.2018-31.07.2020): 

Registration via WebOodi.

Description

Registration and further information