Omfattning: 5
Tidtabel: 08.01.2019 - 10.04.2019
Undervisningsperiod (är i kraft 01.08.2018-31.07.2020):
III - IV Spring (2018-2019, 2019-2020)
Lärandemål (är i kraft 01.08.2018-31.07.2020):
After the course, students will understand the basic microscopy theory for electron microscopes and learns how to use following microscopy methods for material science applications:
1. Transmission electron microscopy TEM
2. Scanning electron microscopy SEM
3. Atomic force microscopy
4. Electron microscopy tomography
Innehåll (är i kraft 01.08.2018-31.07.2020):
The course gives basic knowledge of the microscopy of materials nanoscale structures - including soft and hard materials. Lectures will concentrate on transmission electron microscopy (TEM), cryo-electron microscopy, high resolution imaging, electron diffraction and analytical microscopy by using elemental analyses (EDX, EELS). Additionally scanning electron microscopy (SEM), atomic force microscopy (AFM) and methods to prepare samples are lectures.
Metoder, arbetssätt och bedömningsgrunder (är i kraft 01.08.2018-31.07.2020):
Teaching methods: Lectures 22h 2h/week
Assessment criteria: Exam
Arbetsmängd (är i kraft 01.08.2018-31.07.2020):
24 + 24 (2 + 2)
Studiematerial (är i kraft 01.08.2018-31.07.2020):
to be announced
Ersättande prestationer (är i kraft 01.08.2018-31.07.2020):
This course replaces the course Tfy-125.4313 Microscopy of Nanomaterials.
Kursens webbplats (är i kraft 01.08.2018-31.07.2020):
https://mycourses.aalto.fi/course/search.php?search=PHYS-E0525
Bedömningsskala (är i kraft 01.08.2018-31.07.2020):
0-5
Anmälning (är i kraft 01.08.2018-31.07.2020):
Registration via WebOodi.
- Lärare: Jiang Hua
- Lärare: Ruokolainen Janne
- Lärare: Seitsonen Jani