Please note! Course description is confirmed for two academic years (1.8.2018-31.7.2020), which means that in general, e.g. Learning outcomes, assessment methods and key content stays unchanged. However, via course syllabus, it is possible to specify or change the course execution in each realization of the course, such as how the contact sessions are organized, assessment methods weighted or materials used.

LEARNING OUTCOMES

-    The student knows the capabilities and limitations of major materials and surface characterization techniques
-    The student can select the most proper materials characterization methods for particular sample
-    The student can critically evaluate the material characterization methods used in research papers
-    The student can perform data analysis on the results obtained in laboratory experiments

Credits: 5

Schedule: 07.09.2020 - 03.12.2020

Teacher in charge (valid 01.08.2020-31.07.2022): Girish Tewari

Teacher in charge (applies in this implementation): Yanling Ge, Roman Nowak, Girish Tewari

Contact information for the course (applies in this implementation):

This
course is an introduction for Master's students to Materials
Characterization. It is mandatory to all Funtional Materials (FM) major
students. The maximum amount of students on the course is limited and
the FM major students have priority. Note that the course  registration
will close before the course starts and all accepted students will get a
confirmation.

Syllabus: In this course first day of week one
lecture dedicated to the the theoretical part, will be delivered and this
will be followed by experimental sessions for rest four days of the
week. Following are the topics

1. X-ray diffraction (XRD)

2. Transmission Electron Micrscopy TEM

3. Nanoindentation 

4. Optical Micrscope

5. Scanning Electron Microscopy (SEM)

6.Energy-dispersive X-ray spectroscopy (EDS)

7. Electronic Transport (ET)

8. Raman Spectroscopy

9. X-ray photoelectron spectroscopy (XPS)



CEFR level (applies in this implementation):

Language of instruction and studies (valid 01.08.2020-31.07.2022):

Teaching language: English

Languages of study attainment: English

CONTENT, ASSESSMENT AND WORKLOAD

Content
  • Valid 01.08.2020-31.07.2022:

    At this course, the student can exploit most common materials characterization methods to characterize the structure and properties of materials. The student can evaluate the capabilities and limitations of major materials and surface characterization techniques such as: Optical microscopy, nanoindentation, Raman, Electronic Transport, XRF, XRD, AFM, TEM, SEM, EDS, WDS, XPS.

  • Applies in this implementation:

    1.  X-Ray
    Diffraction Methods, (XRD): X-ray radiation, Instrumentation,
    Theoretical Background, X-ray diffractometry           Contact session 1

    2.  Transmission
    Electron Microscopy  (TEM): Instrumentation, Specimen preparation,
    Image modes                                           Contact session 2

    3. Nanoindentation Examination of Crystalline
    Solid Surfaces”   General
    Introduction
    Indentation DataNanoindentation
    of Ceramics, Semiconductors, and Superconductors

                                                                             
                                                                           
                                      Contact session 3

    4. Optical  Microscopy (OM) : Operating principlesInstrumentationImaging Modes, Confocal Microscopy  Contact session 4

    5. 
    Scanning Electron Microscopy (SEM): Instrumentation, Contrast formation, Operation variablesSpecimen Preparation Contact session 5

    6. X-Ray spectroscopy for
    Elemental Analysis  (EDS+WDS): Features of Characteristic
    X-rays, X-Ray Fluorescence
    Spectrometry (WDS and EDS), EDS in Electron Microscopes, Qualitative and
    Quantitative Analysis
    Contact session 6

    7. Electronic Transport in SemiconductorsElectronic Band (structure) diagrams of semiconductors, Resistvity and Hall effect theory and experiment    Contact session 7

    8. Vibrational Spectroscopy for Molecular Analysis, (Raman): Theoretical Background, Raman Microscopy, Interpretation of
    Vibrational Spectra
    Contact session 8

    9. 
    Electron Spectroscopy for Surface Analysis (XPS ): Basic Principles 
    (XPS)
    , Instrumentation, Characteristics of Electron Spectra  (XPS )Qualitative
    and Quantitative Analysis 
    Contact session 9

    10.  Secondary Ion Mass Spectrometry for Surface Analysis, SIMS: Basci Principles, Instrumentation, Surface structure analysis, SIMS imagingSIMS depth profilingContact session 10





Assessment Methods and Criteria
  • Valid 01.08.2020-31.07.2022:

    Weekly seminars, 5 laboratory projects, written reports, examination

  • Applies in this implementation:

    Evaluation criteria
    1. 5 laboratory reports (including the
    pre-task), 60 %
    At
    least 4 laboratory participations are requirement to pass the course [get to
    the exam]
    Laboratory report

    Laboratory
    report (5 x 12p.) = 60 marks

    2.  Oral Exam, 30 %
    Contact sessions and exam

    Oral exam  = 30 marks

           - A method (max. 10 p.)

           -
    Interpretation of a case ( max. 20 p.) 

    3. Other tasks 10 % (Not obligatory)

    Course feedback (webpropol)    4

    Analysis
    of the data: case study (volunteer)                  6

     Total = 10 marks

    Minimum
    60 marks to pass the course Grade
    table provided after all oral exams completed

Workload
  • Valid 01.08.2020-31.07.2022:

    5 cr = 135 h

    Contact teaching

    5 Laboratory works

    Independent work and reporting

    Reporting

  • Applies in this implementation:

    Contact session 1.5 hrs.

    Laboratory Practice 16 hrs.

    In total 17.5 hrs. per week.


DETAILS

Study Material
  • Valid 01.08.2020-31.07.2022:

    Yang Leng, Materials Characterization : Introduction to Microscopic and Spectroscopic Methods", Wiley-VCH, 2013

  • Applies in this implementation:

    Course material is available at MyCourses.fi page under section course material

Prerequisites
  • Valid 01.08.2020-31.07.2022:

    Laboratory safety course CHEM-A1010 or CHEM-E0140

FURTHER INFORMATION

Details on the schedule
  • Applies in this implementation:

    Tentative timetable for the contact sessions and laboratory works

    (will be updated when confirmed)

    Week

    Contact session Date

    Contact session

    Laboratory

    Pre-assignment

    37

    7.9

    Introduction to
    different methods (+ exam questions)


    -
        XRD Pre-task

    38

    14.9

    XRD
                    XRD
        TEM Pre-task

    39

    21.9

    TEM

     Nanoindentation
          Pre-task

    40

    28.9

    Nanoindentation
      Nanoindentation
    Optical Microscopy
         Pre-task

    41

    5.10

    Optical Microscopy (OM)

    SEM Pre-task

    42

    12.10

    SEM

    SEM+OM

    EDS Pre-task

    43

    exam week

     -

     -

    -

    44

    26.10

    EDS

        Electronic Transport Pre-task

    45

    2.11

    Electronic Transport (ET)
     Electronic Transport
    Raman Pre-task

    46

    9.11

    Raman
             Raman
        XPS Pre-task

    47

    16.11

    XPS

     Auger
    and SIMS
           Pre-task

    48

    23.11

    Auger
    and SIMS
    +

    Course summary

     -

    -

    49

     

    -

    Oral
    exam slots (30.11)

    -

    50

     

    exam week

    -

    Oral
    exam slots (7.12, 13.12 and 14.12)

    -


Description

Registration and further information