Please note! Course description is confirmed for two academic years, which means that in general, e.g. Learning outcomes, assessment methods and key content stays unchanged. However, via course syllabus, it is possible to specify or change the course execution in each realization of the course, such as how the contact sessions are organized, assessment methods weighted or materials used.
LEARNING OUTCOMES
- The student knows the capabilities and limitations of major materials and surface characterization techniques
- The student can select the most proper materials characterization methods for particular sample
- The student can critically evaluate the material characterization methods used in research papers
- The student can perform data analysis on the results obtained in laboratory experiments
Credits: 5
Schedule: 07.09.2020 - 03.12.2020
Teacher in charge (valid 01.08.2020-31.07.2022): Girish Tewari
Teacher in charge (applies in this implementation): Yanling Ge, Roman Nowak, Girish Tewari
Contact information for the course (applies in this implementation):
This
course is an introduction for Master's students to Materials
Characterization. It is mandatory to all Funtional Materials (FM) major
students. The maximum amount of students on the course is limited and
the FM major students have priority. Note that the course registration
will close before the course starts and all accepted students will get a
confirmation.
Syllabus: In this course first day of week one
lecture dedicated to the the theoretical part, will be delivered and this
will be followed by experimental sessions for rest four days of the
week. Following are the topics
1. X-ray diffraction (XRD) |
2. Transmission Electron Micrscopy TEM |
3. Nanoindentation |
4. Optical Micrscope |
5. Scanning Electron Microscopy (SEM) |
6.Energy-dispersive X-ray spectroscopy (EDS) |
7. Electronic Transport (ET) |
8. Raman Spectroscopy |
9. X-ray photoelectron spectroscopy (XPS) |
CEFR level (applies in this implementation):
Language of instruction and studies (valid 01.08.2020-31.07.2022):
Teaching language: English
Languages of study attainment: English
CONTENT, ASSESSMENT AND WORKLOAD
Content
Valid 01.08.2020-31.07.2022:
At this course, the student can exploit most common materials characterization methods to characterize the structure and properties of materials. The student can evaluate the capabilities and limitations of major materials and surface characterization techniques such as: Optical microscopy, nanoindentation, Raman, Electronic Transport, XRF, XRD, AFM, TEM, SEM, EDS, WDS, XPS.
Applies in this implementation:
1. X-Ray
2. Transmission
Diffraction Methods, (XRD): X-ray radiation, Instrumentation,
Theoretical Background, X-ray diffractometry Contact session 1
Electron Microscopy (TEM): Instrumentation, Specimen preparation,
Image modes Contact session 23. Nanoindentation Examination of Crystalline
Solid Surfaces” General
Introduction, Indentation Data, Nanoindentation
of Ceramics, Semiconductors, and Superconductors
Contact session 34. Optical Microscopy (OM) : Operating principles, Instrumentation, Imaging Modes, Confocal Microscopy Contact session 4
5.
Scanning Electron Microscopy (SEM): Instrumentation, Contrast formation, Operation variables, Specimen Preparation Contact session 56. X-Ray spectroscopy for
Elemental Analysis (EDS+WDS): Features of Characteristic
X-rays, X-Ray Fluorescence
Spectrometry (WDS and EDS), EDS in Electron Microscopes, Qualitative and
Quantitative Analysis Contact session 67. Electronic Transport in Semiconductors: Electronic Band (structure) diagrams of semiconductors, Resistvity and Hall effect theory and experiment Contact session 7
8. Vibrational Spectroscopy for Molecular Analysis, (Raman): Theoretical Background, Raman Microscopy, Interpretation of
Vibrational SpectraContact session 89.
Electron Spectroscopy for Surface Analysis (XPS ): Basic Principles
(XPS), Instrumentation, Characteristics of Electron Spectra (XPS ), Qualitative
and Quantitative Analysis Contact session 910. Secondary Ion Mass Spectrometry for Surface Analysis, SIMS: Basci Principles, Instrumentation, Surface structure analysis, SIMS imaging, SIMS depth profilingContact session 10
Assessment Methods and Criteria
Valid 01.08.2020-31.07.2022:
Weekly seminars, 5 laboratory projects, written reports, examination
Applies in this implementation:
Evaluation criteria1. 5 laboratory reports (including the
pre-task), 60 %At
least 4 laboratory participations are requirement to pass the course [get to
the exam]Laboratory reportLaboratory
report (5 x 12p.) = 60 marks2. Oral Exam, 30 %Contact sessions and examOral exam = 30 marks
- A method (max. 10 p.)
-
3. Other tasks 10 % (Not obligatory)
Interpretation of a case ( max. 20 p.)Course feedback (webpropol) 4
Analysis
of the data: case study (volunteer) 6Total = 10 marks
Minimum
60 marks to pass the course Grade
table provided after all oral exams completed
Workload
Valid 01.08.2020-31.07.2022:
5 cr = 135 h
Contact teaching
5 Laboratory works
Independent work and reporting
Reporting
Applies in this implementation:
Contact session 1.5 hrs.
Laboratory Practice 16 hrs.
In total 17.5 hrs. per week.
DETAILS
Study Material
Valid 01.08.2020-31.07.2022:
Yang Leng, Materials Characterization : Introduction to Microscopic and Spectroscopic Methods", Wiley-VCH, 2013
Applies in this implementation:
Course material is available at MyCourses.fi page under section course material
Prerequisites
Valid 01.08.2020-31.07.2022:
Laboratory safety course CHEM-A1010 or CHEM-E0140
FURTHER INFORMATION
Details on the schedule
Applies in this implementation:
Tentative timetable for the contact sessions and laboratory works
(will be updated when confirmed)
Week
Contact session Date
Contact session
Laboratory
Pre-assignment
37
7.9
Introduction to
different methods (+ exam questions)
-XRD Pre-task 38
14.9
XRD XRD TEM Pre-task 39
21.9
TEM Nanoindentation
Pre-task40
28.9
Nanoindentation Nanoindentation Optical Microscopy
Pre-task41
5.10
Optical Microscopy (OM) SEM Pre-task 42
12.10
SEM
SEM+OM
EDS Pre-task
43
exam week
-
-
-
44
26.10
EDS Electronic Transport Pre-task 45
2.11
Electronic Transport (ET) Electronic Transport Raman Pre-task 46
9.11
Raman Raman XPS Pre-task 47
16.11
XPS Auger
and SIMS
Pre-task48
23.11
Auger
and SIMS +Course summary
-
-
49
-
Oral
exam slots (30.11)-
50
exam week
-
Oral
exam slots (7.12, 13.12 and 14.12)-