Please note! Course description is confirmed for two academic years (1.8.2018-31.7.2020), which means that in general, e.g. Learning outcomes, assessment methods and key content stays unchanged. However, via course syllabus, it is possible to specify or change the course execution in each realization of the course, such as how the contact sessions are organized, assessment methods weighted or materials used.
- To provide a fundamental understanding of the theoretical basis as well as the practical application and implementation of diffractometry and transmission electron microscopy (TEM).
- Focus on advanced X-ray diffraction (XRD) methods for qualitative and quantitative phase analysis, orientation or texture determination, as well as crystal structure analysis and refinement.
- The basic principles of TEM operation; To understand different contrast mechanism of TEM images and their applications.
- To understand electron diffraction techniques in TEM, such as SAED, Kikuchi pattern, CBED, EBSD in scanning electron microscope (SEM) and the corresponding applications;
- To understand advance spectroscopy analysis: WDS, EDS, EELS.
- To learn TEM sample preparation, especially by focus ion beam (FIB).
Schedule: 07.09.2020 - 24.11.2020
Teacher in charge (valid 01.08.2020-31.07.2022): Yanling Ge
Teacher in charge (applies in this implementation): Yanling Ge
Contact information for the course (applies in this implementation):
CEFR level (applies in this implementation):
Language of instruction and studies (valid 01.08.2020-31.07.2022):
Teaching language: English
Languages of study attainment: English
CONTENT, ASSESSMENT AND WORKLOAD
This course is providing comprehensive understanding of diffractometry of material in general and transmission electron microscopy (TEM) to doctoral students who need XRD, SEM/FIB and TEM as a routing investigation tool for their research work. However master students in their later studies are also welcomed. In this course we will cover the theoretical basis and major applications. The diffrarctometry focus on X-ray diffraction, which include powder diffraction, texture measurement and Rietveld refinement for solve phase and crystal structure. TEM content will cover the different image contrast mechanism in TEM; electron diffraction and their applications for different field; high resolution TEM; electron invoked spectroscopy such as WDS, EDS and EELS; TEM sample preparation methods for different materials especially with universal FIB/SEM dual beam system.
Assessment Methods and Criteria
Lectures, assignment, lab work, exercise, exam.
5 cr = 135 h
Contact teaching 27 h
Assignments and lab work 10 h
Independent work, exercises, reports and summaries 98 h
Handouts.Williams, D.B., Carter, C.B., 2009. Transmission Electron Microscopy: A Textbook for Materials Science. Springer Science & Business Media.Luo, Z., 2015. A Practical Guide to Transmission Electron Microscopy: Volume I: Fundamentals. Momentum Press.Luo, Z., 2015. A Practical Guide to Transmission Electron Microscopy, Volume II: Advanced Microscopy. Momentum Press.Cullity, B.D., 1978. Elements of X-ray Diffraction. Addison-Wesley Publishing Company.Fultz, B., Howe, J.M., 2013. Transmission Electron Microscopy and Diffractometry of Materials, 4th ed, Graduate Texts in Physics. Springer-Verlag, Berlin Heidelberg.
Substitutes for Courses
This course substitues CHEM-E5225 - Electron Microscopy P.
Compulsory: CHEM-E5140 Materials Characterization, laboratory course (5 cr)
Recommended: CHEM-E4205 Crystallography Basics and Structural Characterization (5 cr)
SDG: Sustainable Development Goals
9 Industry, Innovation and Infrastructure
- Teacher: Yanling Ge