Please note! Course description is confirmed for two academic years (1.8.2018-31.7.2020), which means that in general, e.g. Learning outcomes, assessment methods and key content stays unchanged. However, via course syllabus, it is possible to specify or change the course execution in each realization of the course, such as how the contact sessions are organized, assessment methods weighted or materials used.
After the course, students will understand the basic microscopy theory for electron microscopes and learns how to use following microscopy methods for material science applications:
1. Transmission electron microscopy TEM
2. Scanning electron microscopy SEM
3. Atomic force microscopy
4. Electron microscopy tomography
Schedule: 12.01.2021 - 14.04.2021
Teacher in charge (valid 01.08.2020-31.07.2022): Hua Jiang, Janne Ruokolainen
Teacher in charge (applies in this implementation): Hua Jiang, Janne Ruokolainen
Contact information for the course (applies in this implementation):
CEFR level (applies in this implementation):
Language of instruction and studies (valid 01.08.2020-31.07.2022):
Teaching language: English
Languages of study attainment: English
CONTENT, ASSESSMENT AND WORKLOAD
The course gives basic knowledge of the microscopy of materials nanoscale structures - including soft and hard materials. Lectures will concentrate on transmission electron microscopy (TEM), cryo-electron microscopy, high resolution imaging, electron diffraction and analytical microscopy by using elemental analyses (EDX, EELS). Additionally scanning electron microscopy (SEM), atomic force microscopy (AFM) and methods to prepare samples are lectures.
Assessment Methods and Criteria
Teaching methods: Lectures 22h 2h/week
Assessment criteria: Exam
24 + 24 (2 + 2)
to be announced
Substitutes for Courses
This course replaces the course Tfy-125.4313 Microscopy of Nanomaterials.