Please note! Course description is confirmed for two academic years (1.8.2018-31.7.2020), which means that in general, e.g. Learning outcomes, assessment methods and key content stays unchanged. However, via course syllabus, it is possible to specify or change the course execution in each realization of the course, such as how the contact sessions are organized, assessment methods weighted or materials used.


After the course, students will understand the basic microscopy theory for electron microscopes and learns how to use following microscopy methods for material science applications:

1. Transmission electron microscopy TEM

2. Scanning electron microscopy SEM

3. Atomic force microscopy

4. Electron microscopy tomography

Credits: 5

Schedule: 12.01.2021 - 14.04.2021

Teacher in charge (valid 01.08.2020-31.07.2022): Hua Jiang, Janne Ruokolainen

Teacher in charge (applies in this implementation): Hua Jiang, Janne Ruokolainen

Contact information for the course (applies in this implementation):

CEFR level (applies in this implementation):

Language of instruction and studies (valid 01.08.2020-31.07.2022):

Teaching language: English

Languages of study attainment: English


  • Valid 01.08.2020-31.07.2022:

    The course gives basic knowledge of the microscopy of materials nanoscale structures - including soft and hard materials. Lectures will concentrate on transmission electron microscopy (TEM), cryo-electron microscopy, high resolution imaging, electron diffraction and analytical microscopy by using elemental analyses (EDX, EELS). Additionally scanning electron microscopy (SEM), atomic force microscopy (AFM) and methods to prepare samples are lectures.

Assessment Methods and Criteria
  • Valid 01.08.2020-31.07.2022:

    Teaching methods: Lectures 22h  2h/week
    Assessment criteria: Exam

  • Valid 01.08.2020-31.07.2022:

    24 + 24 (2 + 2)


Study Material
  • Valid 01.08.2020-31.07.2022:

    to be announced

Substitutes for Courses
  • Valid 01.08.2020-31.07.2022:

    This course replaces the course Tfy-125.4313 Microscopy of Nanomaterials.



Registration and further information