Please note! Course description is confirmed for two academic years (1.8.2018-31.7.2020), which means that in general, e.g. Learning outcomes, assessment methods and key content stays unchanged. However, via course syllabus, it is possible to specify or change the course execution in each realization of the course, such as how the contact sessions are organized, assessment methods weighted or materials used.
After the course, students will be able to independently operate following microscopes: Transmission electron microscope TEM, scanning electron microscope SEM and Atomic force microscope AFM. They also learn to do electron tomography imaging and high resolution TEM imaging and elemental analyses.
Schedule: 07.03.2021 - 30.05.2021
Teacher in charge (valid 01.08.2020-31.07.2022): Hua Jiang, Janne Ruokolainen
Teacher in charge (applies in this implementation): Hua Jiang, Janne Ruokolainen
Contact information for the course (applies in this implementation):
CEFR level (applies in this implementation):
Language of instruction and studies (valid 01.08.2020-31.07.2022):
Teaching language: English
Languages of study attainment: English
CONTENT, ASSESSMENT AND WORKLOAD
As practical exercises nanostructured materials are studied with various microscopy methods. Course includes basic sample preparation methods for both hard and soft materials and practical microscopy exercises by using transmission electron microscopy (TEM), scanning electron microscopy (SEM) and atomic force microscopy (AFM).
Assessment Methods and Criteria
Teaching methods: demonstrations 2 x 3 h and laboratory exercises 6 x 3 h
Assessment criteria: Laboratory exercises, written reporting.
demonstrations 2 x 3 h and laboratory exercises 6 x 3 h and written reporting
Substitutes for Courses
This course replaces the course Tfy-125.4314 Microscopy of Nanomaterials, laboratory course.
- Teacher: Ramzy Abdelaziz
- Teacher: Hua Jiang
- Teacher: Janne Ruokolainen
- Teacher: Jani Seitsonen
- Teacher: Fereshteh Sohrabi
- Teacher: Lide Yao