Syllabus

LEARNING OUTCOMES

After the course, students will understand the basic microscopy theory for electron microscopes and learns how to use following microscopy methods for material science applications:

1. Transmission electron microscopy TEM

2. Scanning electron microscopy SEM

3. Atomic force microscopy

4. Electron microscopy tomography

Credits: 5

Schedule: 10.01.2023 - 18.04.2023

Teacher in charge (valid for whole curriculum period):

Teacher in charge (applies in this implementation): Janne Ruokolainen, Hua Jiang

Contact information for the course (applies in this implementation):

CEFR level (valid for whole curriculum period):

Language of instruction and studies (applies in this implementation):

Teaching language: English. Languages of study attainment: English

CONTENT, ASSESSMENT AND WORKLOAD

Content

• valid for whole curriculum period:

  The course gives basic knowledge of the microscopy of materials nanoscale structures - including soft and hard materials. Lectures will concentrate on transmission electron microscopy (TEM), cryo-electron microscopy, high resolution imaging, electron diffraction and analytical microscopy by using elemental analyses (EDX, EELS). Additionally scanning electron microscopy (SEM), atomic force microscopy (AFM) and methods to prepare samples are lectures.

Assessment Methods and Criteria

• valid for whole curriculum period:

  Teaching methods: Lectures 22h  2h/week
  Assessment criteria: Exam

Workload

• valid for whole curriculum period:

  Lectures 22h  2h/week total workload 135h

DETAILS

Substitutes for Courses

• valid for whole curriculum period:

  Substitutes for Courses

Prerequisites

• valid for whole curriculum period:

  Prerequisites

FURTHER INFORMATION

Further Information

• valid for whole curriculum period:

  Teaching Language : English

  Teaching Period : 2022-2023 Spring III - IV
  2023-2024 Spring III - IV

  Enrollment :

  Registration on Sisu (sisu.aalto.fi).

Description