Please note! Course description is confirmed for two academic years, which means that in general, e.g. Learning outcomes, assessment methods and key content stays unchanged. However, via course syllabus, it is possible to specify or change the course execution in each realization of the course, such as how the contact sessions are organized, assessment methods weighted or materials used.

LEARNING OUTCOMES

After the course, students will be able to independently operate following microscopes: Transmission electron microscope TEM, scanning electron microscope SEM and Atomic force microscope AFM. They also learn to do electron tomography imaging and high resolution TEM imaging and elemental analyses.

Credits: 5

Schedule: 27.02.2023 - 30.05.2023

Teacher in charge (valid for whole curriculum period):

Teacher in charge (applies in this implementation): Janne Ruokolainen, Hua Jiang

Contact information for the course (applies in this implementation):

CEFR level (valid for whole curriculum period):

Language of instruction and studies (applies in this implementation):

Teaching language: English. Languages of study attainment: English

CONTENT, ASSESSMENT AND WORKLOAD

Content
  • valid for whole curriculum period:

    As practical exercises nanostructured materials are studied with various microscopy methods. Course includes basic sample preparation methods for both hard and soft materials and practical microscopy exercises by using transmission electron microscopy (TEM), scanning electron microscopy (SEM) and atomic force microscopy (AFM).

Assessment Methods and Criteria
  • valid for whole curriculum period:

    Teaching methods: demonstrations 2 x 3 h and laboratory exercises 6 x 3 h
    Assessment criteria: Laboratory exercises, written reporting.

Workload
  • valid for whole curriculum period:

    demonstrations 2 x 3 h and laboratory exercises 6 x 3 h  and written reporting

DETAILS

Substitutes for Courses
Prerequisites

FURTHER INFORMATION

Further Information
  • valid for whole curriculum period:

    Teaching Language : English

    Teaching Period : 2022-2023 Spring IV - V
    2023-2024 Spring IV - V

    Enrollment :

    Registration on Sisu (sisu.aalto.fi). Number of students participating to the course will be limited (approx. 12). The students are selected to the course based on their applications. Instructions on how to apply to this course can be found from the lecture notes of the course PHYS-E0525 Microscopy of Nanomaterials.