LEARNING OUTCOMES
After the course, students will be able to independently operate following microscopes: Transmission electron microscope TEM, scanning electron microscope SEM and Atomic force microscope AFM. They also learn to do electron tomography imaging and high resolution TEM imaging and elemental analyses.
Credits: 5
Schedule: 06.01.2025 - 13.04.2025
Teacher in charge (valid for whole curriculum period):
Teacher in charge (applies in this implementation): Janne Ruokolainen, Hua Jiang
Contact information for the course (applies in this implementation):
CEFR level (valid for whole curriculum period):
Language of instruction and studies (applies in this implementation):
Teaching language: English. Languages of study attainment: English
CONTENT, ASSESSMENT AND WORKLOAD
Content
valid for whole curriculum period:
As practical exercises nanostructured materials are studied with various microscopy methods. Course includes basic sample preparation methods for both hard and soft materials and practical microscopy exercises by using transmission electron microscopy (TEM), scanning electron microscopy (SEM) and atomic force microscopy (AFM).
Assessment Methods and Criteria
valid for whole curriculum period:
Teaching methods: demonstrations and laboratory exercises
Assessment criteria: Laboratory exercises, written reporting.
Workload
valid for whole curriculum period:
demonstrations and laboratory exercises and written reporting
DETAILS
Substitutes for Courses
valid for whole curriculum period:
Prerequisites
valid for whole curriculum period:
FURTHER INFORMATION
Further Information
valid for whole curriculum period:
Teaching Language: English
Teaching Period: 2024-2025 Spring IV - V
2025-2026 Spring IV - VRegistration:
Number of students participating to the course will be limited (approx. 12). The students are selected to the course based on their applications when registered.
Selection criteria: Ph. D students and Master students whose theses work requires microscopy techniques are prioritized.