Topic outline

  • General

    This course is an introduction for Master's students to Materials Characterization. It is mandatory for all Functional Materials(FM) major students. The maximum amount of students on the course is limited and the FM major students have priority. Note that the course registration will close before the course starts and all accepted students will get a confirmation.

    Syllabus: In this course, the first day of the week one lecture dedicated to the theoretical part will be delivered and this will be followed by experimental sessions for the rest four days of the week. Following are the topics

    1. X-ray diffraction (XRD)

    2. Transmission Electron Microscopy TEM

    3.  Four probe resistivity and Hall measurement (Semiconductor)

    4. Optical Microscopy

    5. Scanning Electron Microscopy (SEM)

    6. Energy-dispersive X-ray spectroscopy (EDS)

    7. Atomic Force Microscopy (AFM)

    8. Raman Spectroscopy

    9. X-ray photoelectron spectroscopy (XPS)

    Welcome

    For any questions contact:

    The course has contact sessions where analysis methods and data analysis is discussed with equipment experts. You need to prepare for the contact session by self-study the topic beforehand.

    The course has 5 laboratory practices that at least 4 must be attended to pass the course. Each laboratory practice will be run for only one week (due to instrument booking) and students participate only in one group (2h) during that week. The groups will be booked with the course starts and you do not need to be in the same group for each laboratory.

    Tentative timetable for the contact sessions and laboratory works

    (will be updated when confirmed)

    Week

    Contact session Date

    Contact session

    Laboratory

    Pre-assignment

    36

    6.9

    Introduction to different methods (+ exam questions)

    		 -
    		     XRD Pre-task

    37

    13.9

    		 XRD
    		                 XRD
    		     TEM Pre-task

    38

    20.9

    		 TEM
    		 Four probe resistivity and Hall measurement (Semiconductor)
          Pre-task

    39

    27.9

    		 Four probe resistivity and Hall measurement (Semiconductor)
    		  Four probe resistivity and Hall measurement (Semiconductor)
    		 Optical Microscopy
     Pre-task

    40

    04.10

    		 Optical Microscopy (OM)
    		SEM Pre-task

    41

    11.10

    SEM

    SEM

    EDS Pre-task

    42

    exam week

     -

     -

    -

    43

    25.10

    		 EDS
    		Atomic Force Microscopy (AFM) 

    44

    01.11

    		 Atomic Force Microscopy (AFM)  AFM Lab
    		 Raman Pre-task

    45

    08.11

    		 Raman
    		  Raman Lab
    		 XPS Pre-task

    46

    15.11

    		 XPS
    		       
    		  Auger and SIMS
      Pre-task

    47

    22.11

    Auger and SIMS +

    Course Summary

     -

    -

    48

     

    -

    Oral exam slots (2.12)

    -

    49

     

    exam week

    -

    Oral exam ( 4.12-14.12)

    -